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Electron Microscopy Sciences AFM Substrate Type P Silicon Wafer 3", 76 mm diameter, <111> Orientation
Supplier: Electron Microscopy Sciences 7189306
These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side.
Diameter: 76 mm
Orientation: <111>
Thickness: 345-470 µm
Roughness: 2nm
Resistance: 1-30 ohms
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