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Terra Universal Cleanroom Probe Tips
SDP

Electropolished tips reduce contact resistance

Supplier:  Terra Universal 911102

Catalog No. 19-111-116

Item Discontinued This item has been discontinued by the supplier. Please to view product availability in your area.


Description

Description

Tip minimizes breakage and can be used for all automatic and manual wafer probing units.

  • Taper length: 6mm (0.23 in.)
  • Taper angle: 5°
  • Tip radius: 0.0127mm (0.0005 in.)
  • Shank diameter: 0.51mm (0.02 in.)

Specifications

Specifications

Automatic and Manual Wafer Probing Units
0.23 in.
Tungsten
Probe Tip
0.58 cm
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